Name and Manufacturer |
JXA 8900 R Electron Probe Microanalyzer |
Electron Gun |
5 - 30 keV acceleration potential |
Detectors |
Backscatter electron detector |
Additional |
sound monitoring of x-ray intensity |
WD Spectrometer 1 |
TAP, PET, LDEB, LDE1 |
WD Spectrometer 2 |
LiF, PET |
WD Spectrometer 3 |
PET, LiF |
WD Spectrometer 4 |
TAP, LDE2 |
WD Spectrometer 5 |
LiFH, PETH |
EDX System |
Jeol integrated system, Si(Li) ED detector |
Vacuum System |
Seiko turbo molecular pump, final pressure: app. 4*10-6 mbar |
Periphericals |
Pointlogger System with Leitz optical microscope, directly connected to the EPMA workstation |
WD Software |
ZAF and phi-rho-z (Armstrong, 1995) online and offline matrix correction |
Carbon Coating |
Cressington 208 Carbon Coater |
Annual expenses |
approx. 18000 Euro (only maintenance and spares) |